00pha-0170b typical biasing configuration technical data pha-0170b suggested maximum ratings parameter absolute maximum [1] device current 40 ma rf input power +13 dbm junction temperature +200 c storage temperature -65 to +200 c cascadable silicon bipolar mmic amplifier pha-0170b description the pha-0170b is a high performance silicon bipolar monolithic microwave integrated circuit (mmic) housed in a hermetic high reliability 70 mil microstrip package. this mmic is designed for use as a general purpose 50 w gain block. typical applications include narrow and broad band if and rf amplifiers in industrial and military applications. 70 mil package dimensions 0.02 0.040 notes: (unless otherwise specified) 1. dimensions are in inches 2. tolerances: x.xxx = 0.005 0.035 0.004 0.002 0.070 0.495 0.030 gnd rf in rf out gnd note: 1. permanent damage may occur if any of these limits are exceeded. 7 0 6 is not the original device manufacturer. 7 0 6 srocures commercial off the shelf product and upscreens per the following process flow. for custom screening requirements, quality conformance inspection, or additional electrical selection, please contact teledyne 0 l f u r z d y h 6 r o x w l r q v. teledyne microwave solutions ? 650-691-9800 ? fax: 650-962-6845 specifications subject to change without notice.
pha-0170b electrical specification [[ 1 ]] -55c +25 c +125 c symbol parameters and test conditions units min max min max min max g p power gain ( ? s 21 ? 2 ) f =0.1 ghz db 14.0 21.0 18.0 20.0 14.0 21.0 d g p gain flatness f=0.1-0.7 ghz db 1.7 1.0 1.7 v d device voltage @ 17 ma v 3.0 7.0 4.5 5.5 3.0 7.0 note: 1. the recommended operating current range for this device is 13 to 25 ma. teledyne 0 l f u r z d y h 6 r o x w l r q v upscreen table 2a 100% screening screening test/operation mil-std-883 method conditions stabilization bake 1008 condition c, ta = +150 c t= 24 hrs. temperature cycling 1010 condition c, -65 to +150c, 10 cycles minimum constant acceleration 2001 condition e, 30,000 g, y1 axis only pre burn-in electrical test (optional) +25c; g p , d g p and vd burn-in 1015 condition b, t= 160 hrs., ta = +125c final electrical test ----- +25c; g p , d g p and vd percent defective allowable (pda) 5% max.; applies to 25c final electrical test hermeticity fine leak gross leak 1014 1014 condition a condition c external visual 2009 group a inspection +125c -55 c n = 116, r = 1 g p , vd and d g p g p , vd and d g p shipment packaging 10 units per strip marking: manufacturer?s marking (if applicable) will remain on devices. 7 0 6 individual packaging will be labeled with 7 0 6 part number and manufacturer date code. 7 0 6 shipment date code will appear on outer label and c of c. certificate of conformance (c of c) will be sent with each shipment. this document provides objective evidence of cougar testing and documents traceability to manufacturers wafer/lot identification. 7 h o h g \ q h 0 l f u r z d y h 6 r o x w l r q v ? ? ) $ ; 6 s h f l i l f d w l r q v v x e m h f w w r f k d q j h z l w k r x w q r w l f h
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